Javid Fatullayev, Mostafa Samak, Anton Sabashnikov, Mohamed Zeriouh, Parwis B. Rahmanian, Yeong-Hoon Choi, Bastian Schmack, Klaus Kallenbach, Arjang Ruhparwar, Kaveh Eghbalzadeh, Pascal M. Dohmen, Matthias Karck, Jens Wippermann, Thorsten Wahlers, Aron-Frederik Popov, Andre R. Simon, Alexander Weymann
(Department of Cardiothoracic Transplantation & Mechanical Circulatory Support, Royal Brompton and Harefield NHS Foundation Trust, Harefield, Middlesex, London, United Kingdom)
Med Sci Monit Basic Res 2015; 21:141-144
Left ventricular assist devices (LVAD) are an increasingly implemented therapeutic intervention for patients with end-stage heart failure. A growing body of evidence, however, has shown an elevated risk of device thrombosis, a major complication jeopardizing the patient’s post-implantation survival. To date, multiple causative factors for LVAD thrombosis have been identified, such as internal shear stress, device material, infection, and inadequate anticoagulation.
Understanding the mechanisms leading to LVAD thrombosis will not only enable device optimization, but also allow for better patient handling, hence improving post-implantation outcome. In this review we highlight the most commonly identified factors leading to LVAD thrombosis and discuss their mechanisms.
Keywords: Embolism and Thrombosis, Heart-Assist Devices, Postoperative Complications